1 THIN FILM STANDARD
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Thin Film Standards of your choice (from list) onto a 3.05mm diameter copper grid.
1 Thin Film Standard
Detailní popis
MAC - X-ray Microanalysis Reference Standards for Transmission Electron Microscopy
We offer an extensive range of fully authenticated compounds and single element standards for the calibration of energy disperse X-ray detectors that are used in conjunction with transmission electron microscopes.
The standards available at present are:
- Any selection from 117 Thin Film compound standards
- Universal Set of 25 compound standards
- Rare Earth Set
- Thin Foil Standards Set for S.T.E.M.
1. Thin Film Standards
These standards are supplied as fine powders that are dispersed onto holey-carbon films and are selected from the range of certified natural and synthetic compounds already in use by us to prepare bulk analysis standards.
The holey-carbon films are supported by a 3.05mm copper grid (400 mesh). However, for analysis under critical conditions, we can supply alternative grid materials, such as beryllium or carbon composite. If requested, we can disperse the standards onto uncoated grids.
Universal set of Thin Film Standards:
| Ag2Te | BaSO4 | Be3Al2Si6O18 | Bi2Se3 | CaMoO4 |
| CaWO4 | CdTe | CeAl2 | Cu2S | FeCr2O4 |
| GaAs | Gd3Ga5O12 | HgTe | InP | InSb |
| KAlSi3O8 | LaB6 | Li2Ta2O6 | (Mg,Fe)2SiO4 | Na3AlF6 |
| Pb-Ge glass | SrTiO3 | TlBr | ZnS | ZrSiO4 |
Více informací najdete na:
www.emsdiasum.com/microscopy/products/standards/tem.aspx#80080
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